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insights from industryDr. Jacob P. HoogenboomAssociate ProfessorFaculty of Applied Sciences at TU Delft
In this interview, Dr. Jacob P. Hoogenboom, from the Faculty of Applied Sciences at TU Delft, talks to AZoM about the development of electron microscopy with FAST-EM, new automated ultra-fast multibeam electron microscope.
Could you give a brief introduction to your group and what you are working on?
I am an associate professor at Delft University of Technology, and I am leading my own research group. I am also heading a section on microscopy instrumentation and techniques, consisting of five principal investigators like myself.
My group is developing novel techniques and novel instruments for microscopy, specifically at the boundary between light and electron microscopy. We try to bridge the limitations of both individual modalities by combining the two in a single system. That offers us new capabilities for imaging that go beyond what is currently possible.
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Groningen
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