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IMAGE: The silicate framework of a diatom does not conduct electricity. For a scanning electron microscope image it would therefore have to be coated, which can result in details of the. view more
Credit: HZDR
A finely focused ion beam (FIB) is a very useful tool in nanotechnology and analytics. Until now, scientists have mainly used FIB technology to prepare samples for certain microscopic techniques, such as troubleshooting in the semiconductor industry. But FIBs can do much more. The EU funded COST network project Focused Ion Technology for Nanomaterials - FIT4NANO , initiated by the Helmholtz-Zentrum Dresden-Rossendorf (HZDR), aims to bring together researchers and companies from all over Europe to jointly develop the technology and open up new applications.