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Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester to be Used for Strategic R&D of Magnetic Materials and Devices

(0) Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a significant order from a tier-1 semiconductor manufacturer for a wafer-level magnetic tester. The equipment will be used for research and development of magnetic materials and devices, which represents a very promising technology for MRAM chips and magnetic sensors. With this announcement, Hprobe s IBEX tester is clearly recognized as an essential solution for the industry. With its very high throughput, the state-of the-art ATE enables high productivity engineering, fast time to market, and early readiness for mass production. The extremely accurate measurements help ensure the high product yield paramount for chip manufacturing.

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