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Bruker Introduces New SKYSCANTM 2214 CMOS Edition Nanoscale 3D X-Ray Microscope
Bruker today announced at the 12th International Conference on Industrial Computed Tomography the new SKYSCANTM 2214 CMOS Edition, a multiscale X-ray microscope based on nano-CT (computed tomography) for industrial and academic research.
Kjell laperre
Emily magee
Geert vanhoyland
International conference on industrial computed tomography
Inc feb
From bruker
International conference
Industrial computed tomography
Line manager
Bruker biospin
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