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qPlus Sensors in Atomic Force Microscopy
qPlus based AFM is known as the best method to study equipment and materials at ultralow temperatures as it allows examining and navigating even the nonconductive parts of the equipment and materials.
Parva chhantyal
Sensor in atomic force microscopy
Journal of vacuum science technology
Electromechanical properties of graphene drumheads
Atomic force microscopy for molecular structure elucidation
Current research
Plus sensor
Atomic force
Scanning tunnel microscopy
Atomic force microscopy
Molecular structure
Vacuum science
Electromechanical properties
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