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Physicist Develops Single-Shot Technique for Semiconductor Analysis
A novel technique for the thorough characterization of semiconductors in a single measurement has been developed by an HZB physicist.
United kingdom
United states
Skyla baily
Artem musiienko
Laura canil
Vitaly podzorov
European patent office
University of potsdam
Rutgers university
Technique for semiconductor analysis
Nature electronics
Nature communications
Testing different semiconductor materials
Develops single shot technique
Semiconductor analysis
Light induced magneto transport
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