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Atomic force microscopy (AFM) is a powerful microscopy technique. It is used to acquire high-resolution images at the nanoscale to better understand the properties of matter.

United statesRunze maTakeshi fukumaJinbo pengIlamaran sivarajahYing jiangJing guoChristoph gerberCalvin quateHeinrich rohrerIlamaran sivarajahdecGerd binnigApplications of atomic force microscopyAtomic force microscopyType of forcesTechnology of advanced materials