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SandBox Semiconductor to share its Expertise in Leveraging AI in Semiconductor Process Development at SPIE Advanced Lithography + Patterning Conference

SandBox Semiconductor to share its Expertise in Leveraging AI in Semiconductor Process Development at SPIE Advanced Lithography + Patterning Conference
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United statesRebecca rennerMeghali chopraMokbel karamSemiconductor process developmentSandbox semiconductorSandbox semiconductor technologyReportable incBox semiconductorPatterning conferenceVirtual metrologyEtch challenges for pattern middle of lineContact trench in monolithicDeliver two presentations includingBox semiconductor technology used

SandBox Semiconductor Adds Hybrid Metrology Capabilities to Industry s Leading Physics-based, AI-enabled Process Optimization Platform, Creating the First Software Solution to Holistically Address Process Development Challenges – EEJournal

SandBox Semiconductor Adds Hybrid Metrology Capabilities to Industry s Leading Physics-based, AI-enabled Process Optimization Platform, Creating the First Software Solution to Holistically Address Process Development Challenges – EEJournal
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United statesMeghali chopraAshwath raoSenior research analystCounterpoint researchSandbox semiconductorSandbox studioBox semiconductor