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Spirox and Southport announce SiC defect tool

Our selection of industry specific magazines cover a large range of topics. ....

Paul Yang , Stacking Fault ,

Spirox and Southport Launch Industry-first Non-Destructive SiC Defect Inspection System: Saving Significant Costs and Increasing Output; Targeting the Compound Semiconductor Market

/PRNewswire/ Professional semiconductor solution provider Spirox Corporation (TWSE: 3055) in collaboration with its subsidiary, Southport Corporation, has. ....

Hao Chung Kuo , Jay Wang , Ken Tai , Paul Yang , Southport Corporation , Material Inspection Laboratory , Spirox Corporation , Stacking Fault , Chair Professor , Optoelectronic Engineering , Advanced Opto Material Inspection Laboratory , Toray Engineering ,

Spirox Corporation: Spirox and Southport Launch Industry-first Non-Destructive SiC Defect Inspection System: Saving Significant Costs and Increasing Output

Spirox Corporation: Spirox and Southport Launch Industry-first Non-Destructive SiC Defect Inspection System: Saving Significant Costs and Increasing Output
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Paul Yang , Jay Wang , Ken Tai , Stefan Klotter , Hao Chung Kuo , Taiwan Photonics Industry Technology Development Association , Semiconductor Market , Southport Corporation , Prnewswire Spirox Corporation , Compound Semiconductor , Stacking Fault , Chair Professor , Optoelectronic Engineering , Taiwan Photonics Industry , Technology Development Association , Lassen Sie ,