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How to Characterize Ferroelectric Materials

Studying ferroelectric materials can be done with the help of piezoresponse force microscopy (PFM), due to the sensitivity and nanometer-level resolution it inherits from AFM. Bruker discusses the best modes and practices in regards to PFM measurements in a new application note. ....

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Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity

Pursuing improved sensitivity when measuring physical properties and measurement at atomic and molecular scalesTOKYO, June 28, 2022 - (JCN Newswire) - Hitachi High-Tech Corporation today announced the ....

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