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Elevating the performance of ionization vacuum gauges with simulation – CERN Courier

Multiphysics modelling underpinned development of an advanced ionization gauge for pressure measurements in high-vacuum and ultrahigh-vacuum systems. ....

Martin Wu , Francesco Scuderi , European Metrology Programme For Innovation , University Lisbon , Ion Reference Gauge , European Metrology Programme , Reference Gauge ,

BAM: EU funding to help improve performance of semiconductors

The Bundesanstalt für Materialforschung und -prüfung (BAM) is researching new nanomaterials for semiconductor technology in three EU joint projects. The goal is to precisely determine the properties of the materials and thus significantly improve the performance quality of microchips. ....

Andreas Hertwig , European Union , European Metrology Programme For Innovation , European Metrology Programme ,