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Comprehensive optical wafer testing for μLEDs at a LumiTop 4000 test station

Comprehensive optical wafer testing for μLEDs at a LumiTop 4000 test station 09 Dec 2020 Instrument Systems offers a unique camera-based measurement solution for μLED wafer testing that generates 2-dimensional, pixel-resolved optical analyses within given cycle times. The LumiTop 4000 has a resolution of 12 MP and can detect the smallest of defects and inhomogeneities on the wafer. Thanks to a 100 mm macro lens, the camera enables fast parallel inline analysis of all μLEDs on a wafer at a single test station. μLEDs are renowned for being an exacting new display technology. They are smaller than 100 micrometers and have exceptional optical properties that enable the manufacture of displays with a broad color gamut, high contrast and extremely high resolution. Particularly in mass production, they present new challenges for the optical quality tests required at every stage of production, i.e. including wafer level. This cannot be achieved with standard tests, i.e. sequential

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